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Figure 1 | BMC Genomics

Figure 1

From: A genome-wide deletion mutant screen identifies pathways affected by nickel sulfate in Saccharomyces cerevisiae

Figure 1

S. cerevisiae genomic phenotypic screen with NiSO 4 . (A) Representative plate of the YPD-agar plates containing no NiSO4 (untreated), low (0.75), or high (1.25) concentration of NiSO4 spotted with 96 S. cerevisiae gene deletion mutant strains used in the genomic phenotypic screen. Dark blue, purple, yellow, light blue and pink squares identify the NiSO4-sensitive deletion strains fob1Δ, ydr338cΔ, trp4Δ, gga1Δ, and eaf1Δ, respectively. Red and green squares identify the NiSO4-resistant deletion strains doa4Δ and ydr089wΔ, respectively. (B) Recompiled images of nickel-sensitive and resistant identified on the plate in A. doa4Δ and ydr089wΔ are examples of how Ni-resistant mutant strains were identified, whereas the colony of the control strain changed color from white to gray with increasing concentrations of NiSO4, the resistant strains did not. The Ni-sensitive strains fob1Δ, ydr338cΔ, trp4Δ, gga1Δ, and eaf1Δ exhibited more of a growth defect compared to the control strain even under low (0.75 mM) NiSO4 concentration.

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