Fig. 4From: Genome-enabled prediction using probabilistic neural network classifiersHistograms of the AUC criterion and their standard deviation (error bars) for the wheat datasets. a grain yield (GY) in seven environments (1–7) of classifiers MLP and PNN of the upper 15 and 30 % classes; b days to heading (DTH) in ten environments (1–10) of MLP and PNN in the lower 15 and 30 % classesBack to article page