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Fig. 5 | BMC Genomics

Fig. 5

From: Identification of novel loci associated with maturity and yield traits in early maturity soybean plant introduction lines

Fig. 5

Genome-wide association analysis Manhattan plots for (a) days to maturity (DTM), (b) days to flowering (DTF), (c) days to pod filling (DTPF), (d) 100 seed weight (SW), and (e) yield. Lines represent the significance threshold as determined by Bonferroni multiple comparisons corrections equivalent to P < 0.05 (blue lower line) or P < 0.01 (red upper line)

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BMC Genomics

ISSN: 1471-2164

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