Fig. 2

Each pair of plots give an overview of the comparisons of the quality of the assemblies across assemblers for E. coli and yeast datasets. a&b: Histograms with error bars plotted between % of 2D reads and N50_value of an assembly show the variation in N50 value of an assembly among different assembler algorithms and how it varies with respect to the data size. c&d: Histograms with error bars plotted between % of 2D reads and number of contigs generated from an assembly, shows how the number of contigs generated vary with respect to the mean contig length for each respective assembler algorithm across various bins of respective datasets. e&f: Histograms showing the percentage of 2D reads employed on X-axis versus the average length of the contigs obtained using each algorithm. g&h: Histograms showing the sum of the lengths of all the contigs generated by an assembler as a function of the percentage of the total reads employed in the assembly. In each set of plots, left panel corresponds to E. coli dataset while the plots in the right panel correspond to the Yeast dataset. In all the plots labeled numeric values on histograms indicate corresponding values of the metric in respective color representing each tool