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Fig. 4 | BMC Genomics

Fig. 4

From: Genome rearrangements in Escherichia coli during de novo acquisition of resistance to a single antibiotic or two antibiotics successively

Fig. 4

Deletions detected in strains with de novo acquired antibiotic resistance a: Deletion of prophage e14 associated genes in strains exposed to any of the four antibiotics. b: Partial deletion of clpS and clpA in strains exposed to enrofloxacin and tetracycline. Figures depict genomic organization at point of deletion. The genes involved and the resulting gene products are displayed under the figure. Prophage associated genes are not shown because the resulting gene products are mostly not characterized. See Table 1 for detailed information on prevalence of the deletions

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