Fig. 3
From: Temporal transcriptomic profiling elucidates sorghum defense mechanisms against sugarcane aphids
Upset intersection plots of the total number of differentially expressed genes (DEGs) [upregulated (U) and downregulated (D); P < 0.05, fold change > 2] present in a sorghum line at a given time point on horizontal bars (numbers shown on the left of each horizontal bar) and the total number of DEGs common in different sorghum lines represented by vertical bars (numbers shown at the top of each vertical bar). Vertical lines joining the points depicts that the sorghum line corresponding to the point have common DEGs in RTx430, SCA-resistant (SC265), and SCA-susceptible (SC1345) sorghum lines. A DEGs at 6 hpi, B DEGs at 24 hpi, C DEGs at 48 hpi, D DEGs at 7 dpi